MUHAMMAD SANA ULLAH; DREW K. TALLMAN. Effect of Parametric Variations on Electromigration in Integrated Circuits. Global Journal of Science Frontier Research, [S. l.], v. 18, n. A9, p. 31–36, 2018. DOI: 10.34257/GJSFRAVOL18IS9PG9. Disponível em: https://journalofscience.org/index.php/GJSFR/article/view/2343. Acesso em: 6 may. 2024.